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DCG Systems® Focuses on Static Optical Failure Analysis with the Introduction of Meridian M™

FREMONT, CA, Oct. 5 (Korea Bizwire) – DCG Systems® today announced the release of the Meridian M™ system for isolation of routine and challenging electrical faults at the wafer level. Offering photon emission for transistor-level defects and leakage, and a complete portfolio of static laser stimulation techniques for metallization defects, the Meridian M system is [...]

DCG Systems® Acquires MultiProbe™, Creating a Complete Nanoprobing Portfolio

FREMONT, Calif., Jun. 30 (Korea Bizwire) – DCG Systems® announced today that it has acquired the assets of MultiProbe™, the leading provider of atomic force-based nanoprobing solutions for the semiconductor industry. MultiProbe was founded in 2001 to address the growing needs of failure analysis (FA) engineers and to help the industry find solutions for deep [...]