Nearfield Instruments and Singapore’s A*STAR IME Sign Research Collaboration Agreement to Advance Semiconductor Metrology Solutions for AI and Advanced Packaging Era

SINGAPORE, May 20, 2025 (Korea Bizwire) – Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR IME’s cutting-edge semiconductor research, the [...]