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Nearfield Instruments and Singapore’s A*STAR IME Sign Research Collaboration Agreement to Advance Semiconductor Metrology Solutions for AI and Advanced Packaging Era

SINGAPORE, May 20, 2025 (Korea Bizwire) – Nearfield Instruments, a leader in advanced semiconductor metrology, and the A*STAR Institute of Microelectronics (A*STAR IME) of Singapore, today have signed a multi-year research collaboration agreement to drive innovation in semiconductor metrology technologies. By leveraging Nearfield Instruments’ expertise in high-precision metrology and A*STAR IME’s cutting-edge semiconductor research, the [...]

Nearfield Instruments Receives Purchase Orders from Major US Customer, and Establishes Nearfield Instruments USA Inc.

ROTTERDAM, The Netherlands, Feb. 10, 2025 (Korea Bizwire) – Nearfield Instruments, a leading provider of advanced metrology and inspection solutions for the semiconductor industry, is pleased to announce the establishment of its U.S. subsidiary, Nearfield Instruments USA Inc. This strategic move strengthens the company’s presence in North America, allowing it to better support customers in [...]

Nearfield Instruments Receives Purchase Order for QUADRA High-Throughput Metrology System from Leading Semiconductor Manufacturer in East Asia

ROTTERDAM, The Netherlands, Oct. 20 (Korea Bizwire) — Nearfield Instruments, a leading innovator in advanced process control metrology solutions, is proud to announce the receipt of a purchase order for its flagship QUADRA High-Throughput Process Control Metrology product. The order, secured after an intensive supplier selection process, was placed by a prominent semiconductor manufacturer in [...]