Researchers have developed an innovative nanofilm sensor that can diagnose building deterioration through color changes. (Image courtesy of the Korea Institute of Machinery and Materials)
DAEJEON, Nov. 5 (Korea Bizwire) – The Korea Institute of Machinery and Materials (KIMM) announced on November 4 that researchers have developed an innovative nanofilm sensor that can diagnose building deterioration through color changes, marking a significant advance in structural health monitoring technology.
Led by principal researcher Yoon Jae Sung of the department of nano manufacturing technology, the team created a patch sensor that precisely measures structural deformation by quantifying optical color changes in nano-patterns that respond to mechanical stress.
The technology draws inspiration from structural colors found in nature – the same phenomenon responsible for the iridescent hues of male peacock feathers, butterfly wings, and chameleon skin. Unlike traditional monitoring systems, this sensor operates without pigments, dyes, or external power sources.
In a notable breakthrough, the research team’s nano-pattern design maintains consistent coloration regardless of viewing angle, solving a longstanding challenge in structural color technology where colors typically shift with different viewing perspectives.
The team has also developed a monitoring solution that employs artificial intelligence to analyze color change images and detect potential structural risks. The technology is protected by more than 10 domestic patents and one international patent application.
“This nanofilm sensor enables simple and efficient measurement of structural deformation and safety,” said Yoon. He added that the team is currently in discussions with industry partners for technology transfer.
The research findings achieved international recognition when they were featured as the cover article in the September 13 issue of ACS Applied Nano Materials, a prestigious scientific journal.
Kevin Lee (kevinlee@koreabizwire.com)
