DCG Systems® Focuses on Static Optical Failure Analysis with the Introduction of Meridian M™

FREMONT, CA, Oct. 5 (Korea Bizwire) – DCG Systems® today announced the release of the Meridian M™ system for isolation of routine and challenging electrical faults at the wafer level. Offering photon emission for transistor-level defects and leakage, and a complete portfolio of static laser stimulation techniques for metallization defects, the Meridian M system is [...]